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Faster Nanopositioning Advances Microscopy & Analytical Instruments: AFM SNOM RAMAN
PI (Physik Instrumente) LP Posted 06/07/2019
Faster Imaging / Higher Resolution in Microscopy and Analytical Instrumentation. The video explains how advanced nanopositioning technologies such as piezo direct drive stages, parallel kinematics and ultrasonic ceramic motors and can speed up and improve imaging techniques in Atomic Force Microscopy (AFM), Scanning Near-field Optical Microscopy (SNOM) and Confocal Raman Imaging.