Piezo Speed is Enabler for 100% Testing: Microscopy, Surface Metrology

PI (Physik Instrumente) LP Posted 06/07/2019

Scientists from the Fraunhofer Institute for Production Technology IPT in Aachen, Germany have come up with a solution to speed up microscopic testing of large-surface objects, such as well plates, and enables 100% testing for the first time. A fast nano-focus device based on a piezo-ceramic actuator embedded in a flexure guided lens positioning mechanism from PI (Physik Instrumente) is one of the driving forces for this success.